@inproceedings{184e0679d52947c489be363618fa42f9,
title = "Linear diattenuation and retardance measurements in an IR spectropolarimeter",
abstract = "A technique to measure linear diattenuation and retardance spectra of infrared samples in transmission has been developed. A sample is rotated between two fixed linear polarizers in the sample compartment of an infrared spectrometer. The intensity modulation resulting from the rotation of the sample is Fourier analyzed and the diattenuation and retardation of the sample are calculated from these Fourier series coefficients. For single plate devices, such as waveplates, sheet polarizers, or liquid crystals, whose thickness is known, the birefringence spectrum can also be determined. This technique has been utilized in the sample compartment of a Fourier transform infrared spectropolarimeter to determine the linear diattenuation and retardance spectra from 2.5 to 16.5 microns of an infrared multiple order retarder, two achromatic retarders, and a liquid crystal sample.",
author = "Chenault, {David B.} and Chipman, {Russell A.}",
year = "1990",
language = "English (US)",
isbn = "0819403725",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "Publ by Int Soc for Optical Engineering",
pages = "263--278",
editor = "Chipman, {Russel A.} and Morris, {John W.}",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
note = "Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray ; Conference date: 15-05-1990 Through 17-05-1990",
}