Lateral shift variable aberration generators

Iwona A. Palusinski; Jose M. Sasian; John E. Greivenkamp

doi:10.1117/12.321964

Lateral shift variable aberration generators

Iwona A. Palusinski, Jose M. Sasian, John E. Greivenkamp

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	96-98
Number of pages	3
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3482
DOIs	https://doi.org/10.1117/12.321964
State	Published - Sep 21 1998
Event	International Optical Design Conference 1998 - Kona, United States Duration: Jun 8 1998 → Jun 12 1998

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.321964

Cite this

@article{e57547a2b98245708b952b3be9b084b6,

title = "Lateral shift variable aberration generators",

author = "Palusinski, {Iwona A.} and Sasian, {Jose M.} and Greivenkamp, {John E.}",

year = "1998",

month = sep,

day = "21",

doi = "10.1117/12.321964",

language = "English (US)",

volume = "3482",

pages = "96--98",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "International Optical Design Conference 1998 ; Conference date: 08-06-1998 Through 12-06-1998",

}

TY - JOUR

T1 - Lateral shift variable aberration generators

AU - Palusinski, Iwona A.

AU - Sasian, Jose M.

AU - Greivenkamp, John E.

PY - 1998/9/21

Y1 - 1998/9/21

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U2 - 10.1117/12.321964

DO - 10.1117/12.321964

M3 - Conference article

AN - SCOPUS:84863732745

SN - 0277-786X

VL - 3482

SP - 96

EP - 98

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - International Optical Design Conference 1998

Y2 - 8 June 1998 through 12 June 1998

ER -

Lateral shift variable aberration generators

ASJC Scopus subject areas

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