Iterative surface construction for blind deflectometry

Wenchuan Zhao, Logan R. Graves, Run Huang, Weihong Song, Daewook Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

Freeform optics provide excellent performance for a wide variety of applications. However, obtaining an accurate freeform surface measurement is highly challenging due to its large aspheric/freeform departure. It has been proven that SCOTS (Software Configurable Optical Test System), an advanced deflectometry system developed at the University of Arizona, can measure the departure of a freeform surface from the desired shape with nanometer accuracy. Here, a new data processing technique was used to measure a freeform surface without any prior knowledge of the shape of the surface. Knowing only the geometry of one point on the test surface, this method can take a blind measurement of a freeform surface and arrive at the true surface through iterative construction.

Original languageEnglish (US)
Title of host publication8th International Symposium on Advanced Optical Manufacturing and Testing Technology
Subtitle of host publicationOptical Test, Measurement Technology, and Equipment
EditorsSandy To, Yudong Zhang, Ming Xu, Fan Wu
PublisherSPIE
ISBN (Electronic)9781628419191
DOIs
StatePublished - 2016
Event8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, AOMATT 2016 - Suzhou, China
Duration: Apr 26 2016Apr 29 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9684
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, AOMATT 2016
Country/TerritoryChina
CitySuzhou
Period4/26/164/29/16

Keywords

  • Blind
  • Deflectometry
  • Freeform
  • Iterative
  • Metrology
  • SCOTS

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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