TY - GEN
T1 - Investigation of the sparse MoM reaction matrices produced in stripline packaging problems
AU - Wang, Xing
AU - Zhu, Zhaohui
AU - Cao, Yi
AU - Dvorak, Steven L.
AU - Prince, John L.
PY - 2006
Y1 - 2006
N2 - In most applications the Method of Moments (MoM) generates full reaction matrices. However, in this paper, we demonstrate that sparse reaction matrices are produced when modeling stripline interconnects. This is demonstrated by investigating the sparse nature of the MoM reaction matrices that are produced when using the Full-Wave Layered Interconnect Simulator (UA-FWLIS) with a parallel-plate Green's function. In order to explain the sparse nature of the reaction matrices, the electric fields that are excited by horizontal and vertical electric dipole sources are briefly overviewed. Then the variations of the reaction elements with distance are studied, and this information is used to provide a cut-off criterion for the reaction element calculations. We found that by applying sparse matrix storage techniques and a sparse matrix solver, the matrix solution time is dramatically improved when compared with a commercial MoM-based simulator.
AB - In most applications the Method of Moments (MoM) generates full reaction matrices. However, in this paper, we demonstrate that sparse reaction matrices are produced when modeling stripline interconnects. This is demonstrated by investigating the sparse nature of the MoM reaction matrices that are produced when using the Full-Wave Layered Interconnect Simulator (UA-FWLIS) with a parallel-plate Green's function. In order to explain the sparse nature of the reaction matrices, the electric fields that are excited by horizontal and vertical electric dipole sources are briefly overviewed. Then the variations of the reaction elements with distance are studied, and this information is used to provide a cut-off criterion for the reaction element calculations. We found that by applying sparse matrix storage techniques and a sparse matrix solver, the matrix solution time is dramatically improved when compared with a commercial MoM-based simulator.
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U2 - 10.1109/ECTC.2006.1645814
DO - 10.1109/ECTC.2006.1645814
M3 - Conference contribution
AN - SCOPUS:33845584524
SN - 1424401526
SN - 9781424401529
T3 - Proceedings - Electronic Components and Technology Conference
SP - 1256
EP - 1261
BT - Proceedings - IEEE 56th Electronic Components and Technology Conference
T2 - IEEE 56th Electronic Components and Technology Conference
Y2 - 30 May 2006 through 2 June 2006
ER -