Introduction

Amit Ashok; Mark A Neifeld; Michael E. Gehm

doi:10.1117/12.2244794

Introduction

Amit Ashok, Mark A Neifeld, Michael E. Gehm

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Article number	984701
Pages (from-to)	xi-xii
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9847
DOIs	https://doi.org/10.1117/12.2244794
State	Published - 2016
Event	Anomaly Detection and Imaging with X-Rays (ADIX) Conference - Baltimore, United States Duration: Apr 19 2016 → Apr 20 2016

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.2244794

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title = "Introduction",

author = "Amit Ashok and Neifeld, {Mark A} and Gehm, {Michael E.}",

year = "2016",

doi = "10.1117/12.2244794",

language = "English (US)",

volume = "9847",

pages = "xi--xii",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Anomaly Detection and Imaging with X-Rays (ADIX) Conference ; Conference date: 19-04-2016 Through 20-04-2016",

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T1 - Introduction

AU - Ashok, Amit

AU - Neifeld, Mark A

AU - Gehm, Michael E.

PY - 2016

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DO - 10.1117/12.2244794

M3 - Editorial

AN - SCOPUS:85021678942

VL - 9847

SP - xi-xii

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

M1 - 984701

T2 - Anomaly Detection and Imaging with X-Rays (ADIX) Conference

Y2 - 19 April 2016 through 20 April 2016

ER -

Introduction

ASJC Scopus subject areas

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