| Original language | English (US) |
|---|---|
| Pages (from-to) | ix |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 7793 |
| DOIs | |
| State | Published - 2010 |
| Event | Optical System Alignment, Tolerancing, and Verification IV - San Diego, CA, United States Duration: Aug 1 2010 → Aug 2 2010 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering