Interval Estimates for Yield Modeling

C. L. Winter; W. L. Cook

doi:10.1109/JSSC.1986.1052578

Interval Estimates for Yield Modeling

C. L. Winter
, W. L. Cook

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Most recent papers on yield modeling have given parametric point estimates of yield through a mixed Gamma–Poisson distribution. In this paper we offer interval estimates of both yield and expected yield for the Gamma–Poisson under restricted but practical conditions.

Original language	English (US)
Pages (from-to)	590-591
Number of pages	2
Journal	IEEE Journal of Solid-State Circuits
Volume	21
Issue number	4
DOIs	https://doi.org/10.1109/JSSC.1986.1052578
State	Published - Aug 1986
Externally published	Yes

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1109/JSSC.1986.1052578

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title = "Interval Estimates for Yield Modeling",

abstract = "Most recent papers on yield modeling have given parametric point estimates of yield through a mixed Gamma–Poisson distribution. In this paper we offer interval estimates of both yield and expected yield for the Gamma–Poisson under restricted but practical conditions.",

author = "Winter, \{C. L.\} and Cook, \{W. L.\}",

year = "1986",

month = aug,

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journal = "IEEE Journal of Solid-State Circuits",

issn = "0018-9200",

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AU - Cook, W. L.

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M3 - Article

AN - SCOPUS:0022767092

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EP - 591

JO - IEEE Journal of Solid-State Circuits

JF - IEEE Journal of Solid-State Circuits

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ER -

Interval Estimates for Yield Modeling

Abstract

ASJC Scopus subject areas

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