Interval Estimates for Yield Modeling

C. L. Winter, W. L. Cook

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


Most recent papers on yield modeling have given parametric point estimates of yield through a mixed Gamma–Poisson distribution. In this paper we offer interval estimates of both yield and expected yield for the Gamma–Poisson under restricted but practical conditions.

Original languageEnglish (US)
Pages (from-to)590-591
Number of pages2
JournalIEEE Journal of Solid-State Circuits
Issue number4
StatePublished - Aug 1986

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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