Abstract
This work demonstrates how optical metrology of conformal domes can be accomplished by extending current aspheric testing techniques. Both transmitted wavefront testing of sub-apertures and full aperture null testing show feasibility.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 221-226 |
| Number of pages | 6 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3705 |
| State | Published - 1999 |
| Event | Proceedings of the 1999 Window and Dome Technologies and Materials VI - Orlando, FL, USA Duration: Apr 5 1999 → Apr 6 1999 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering