TY - GEN
T1 - Interferometer-induced wavefront errors when testing in a nonnull configuration
AU - Lowman, Andrew E.
AU - Greivenkamp, John E.
PY - 1994
Y1 - 1994
N2 - Sub-Nyquist interferometry and other extended range techniques have the potential to allow measurement of aspheric surfaces with large departures from a reference sphere. The optic is tested in a non-null configuration, and aberrations are introduced into the wavefront by the interferometer optics. Consequently, the wavefront measured at the sensor is different from the wavefront initially produced by the test surface, and the interferometer must be calibrated if useful measurements of aspheres are to be made. The aberrations produced by a Twyman-Green interferometer for this application were examined. To study the severity of these interferometer induced errors, a defocused spherical surface was used to generate a non-null configuration. With wavefront departures up to 400 waves, errors up to 12 waves rms were found to be introduced by the non-null test setup.
AB - Sub-Nyquist interferometry and other extended range techniques have the potential to allow measurement of aspheric surfaces with large departures from a reference sphere. The optic is tested in a non-null configuration, and aberrations are introduced into the wavefront by the interferometer optics. Consequently, the wavefront measured at the sensor is different from the wavefront initially produced by the test surface, and the interferometer must be calibrated if useful measurements of aspheres are to be made. The aberrations produced by a Twyman-Green interferometer for this application were examined. To study the severity of these interferometer induced errors, a defocused spherical surface was used to generate a non-null configuration. With wavefront departures up to 400 waves, errors up to 12 waves rms were found to be introduced by the non-null test setup.
UR - http://www.scopus.com/inward/record.url?scp=0028757125&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0028757125&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0028757125
SN - 0819412538
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 173
EP - 181
BT - Proceedings of SPIE - The International Society for Optical Engineering
A2 - Pryputniewicz, Ryszard J.
A2 - Brown, Gordon M.
A2 - Juptner, Werner P.
PB - Publ by Society of Photo-Optical Instrumentation Engineers
T2 - Interferometry VI: Applications
Y2 - 14 July 1993 through 15 July 1993
ER -