Interferometer errors due to the presence of fringes

Andrew E. Lowman, John E. Greivenkamp

Research output: Contribution to journalArticlepeer-review

32 Scopus citations

Abstract

Phase-shifting interferometry permits analysis of complex interferograms. However, the measurement accuracy is reduced as the number of fringes is increased. The wavefront from a defocused spherical surface is used to demonstrate this degradation for several different transmission reference objectives.

Original languageEnglish (US)
Pages (from-to)6826-6828
Number of pages3
JournalApplied optics
Volume35
Issue number34
DOIs
StatePublished - Dec 1 1996

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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