Interference enhanced Kerr spectroscopy for very thin absorbing films - Application to amorphous terbium iron

G. A.N. Connell; R. Allen; M. Mansuripur

doi:10.1016/0304-8853(83)90534-6

Interference enhanced Kerr spectroscopy for very thin absorbing films - Application to amorphous terbium iron

G. A.N. Connell
, R. Allen
, M. Mansuripur

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

A new method of obtaining polar Kerr spectra from very thin absorbing films is used to study the thickness dependence of the Curie temperature, compensation temperature and critical behavior of the Fe-subnetwork of amorphous Tb-Fe alloy films. Significant deviations from bulk behavior begin to occur a thickness below about 20 nm.

Original language	English (US)
Pages (from-to)	337-339
Number of pages	3
Journal	Journal of Magnetism and Magnetic Materials
Volume	35
Issue number	1-3
DOIs	https://doi.org/10.1016/0304-8853(83)90534-6
State	Published - Mar 1983
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1016/0304-8853(83)90534-6

Cite this

@article{8311c6d67eb54e6c8d67030940f15889,

title = "Interference enhanced Kerr spectroscopy for very thin absorbing films - Application to amorphous terbium iron",

abstract = "A new method of obtaining polar Kerr spectra from very thin absorbing films is used to study the thickness dependence of the Curie temperature, compensation temperature and critical behavior of the Fe-subnetwork of amorphous Tb-Fe alloy films. Significant deviations from bulk behavior begin to occur a thickness below about 20 nm.",

author = "Connell, \{G. A.N.\} and R. Allen and M. Mansuripur",

year = "1983",

month = mar,

doi = "10.1016/0304-8853(83)90534-6",

language = "English (US)",

volume = "35",

pages = "337--339",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

publisher = "Elsevier B.V.",

number = "1-3",

}

TY - JOUR

T1 - Interference enhanced Kerr spectroscopy for very thin absorbing films - Application to amorphous terbium iron

AU - Connell, G. A.N.

AU - Allen, R.

AU - Mansuripur, M.

PY - 1983/3

Y1 - 1983/3

N2 - A new method of obtaining polar Kerr spectra from very thin absorbing films is used to study the thickness dependence of the Curie temperature, compensation temperature and critical behavior of the Fe-subnetwork of amorphous Tb-Fe alloy films. Significant deviations from bulk behavior begin to occur a thickness below about 20 nm.

AB - A new method of obtaining polar Kerr spectra from very thin absorbing films is used to study the thickness dependence of the Curie temperature, compensation temperature and critical behavior of the Fe-subnetwork of amorphous Tb-Fe alloy films. Significant deviations from bulk behavior begin to occur a thickness below about 20 nm.

UR - https://www.scopus.com/pages/publications/0020098249

UR - https://www.scopus.com/pages/publications/0020098249#tab=citedBy

U2 - 10.1016/0304-8853(83)90534-6

DO - 10.1016/0304-8853(83)90534-6

M3 - Article

AN - SCOPUS:0020098249

SN - 0304-8853

VL - 35

SP - 337

EP - 339

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

IS - 1-3

ER -

Interference enhanced Kerr spectroscopy for very thin absorbing films - Application to amorphous terbium iron

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this