Abstract
A comparison of spectral diffuse reflectance between different national standards laboratories is being planned under the direction of the Comité Consultatif de Photométrie et Radiométrie (CCPR). A similar comparison of bidirectional reflectance distribution factor among laboratories in the United States in support of optical remote sensing measurements is nearing completion. Since this comparison provides valuable lessons for the one organized by the CCPR, pertinent results and their implications are presented.
Original language | English (US) |
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Pages (from-to) | 10-15 |
Number of pages | 6 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 3425 |
DOIs | |
State | Published - 1998 |
Externally published | Yes |
Event | Optical Diagnostic Methods for Inorganic Transmissive Materials - San Diego, CA, United States Duration: Jul 20 1998 → Jul 21 1998 |
Keywords
- Aluminum
- Bidirectional reflectance distribution function
- Comparison
- Diffuse reflectance
- Polytetrafluoroethylene
- Reflectance
- Reflectance factor
- Spectralon
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering