Abstract
A new and comprehensive dielectric tensor characterization instrument is presented for characterization of magneto-optical recording media and non-magnetic thin films. Random and systematic errors of the system are studied. A series of TbFe, TbFeCo, and Co/Pt samples with different composition and thicknesses are characterized for their optical and magneto-optical properties. The optical properties of several non-magnetic films are also measured.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 264-286 |
| Number of pages | 23 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 1663 |
| DOIs | |
| State | Published - 1992 |
| Event | Optical Data Storage Topical Meeting 1992 - San Jose, United States Duration: Feb 9 1992 → Feb 14 1992 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Instrumentation
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
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