@inproceedings{d5d4f3ad984b4e2d9b8d75860330f7a2,
title = "Instantaneous wavefront measurement based on deflectometry",
abstract = "The deflectometry enables high-precision wavefront measurement with large dynamic range. Traditional multi-step phase-shifting fringe-illumination deflectometric methods involve at least three sinusoidal phase-shifting fringe patterns and require a sequential projection, making it not feasible for the instantaneous measurement. In this paper, a colorcoded method with frequency-carrier patterns is proposed to achieve the instantaneous wavefront measurement based on deflectometry. With the color extraction from different channels, composite patterns in x and y directions can be well separated with a single shot. Then, the phase-shifting patterns encoded in different frequencies can be demodulated with the designed filters, by which the local wavefront slopes can be obtained simultaneously to reconstruct the wavefront under test. Both the numerical simulation and experiments are performed to validate the feasibility of proposed method. The proposed method provides a feasible way for the real-time and instantaneous measurement with large dynamic range based on deflectometry.",
keywords = "Color-coded method, Frequency carrier, Fringe illumination, Instantaneous deflectometry",
author = "Zhongming Xie and Daodang Wang and Hanting Gu and Ming Kong and Rongguang Liang and Wentao Zhang",
note = "Funding Information: The activities of this work are supported by National Natural Science Foundation of China (NSFC) (51775528), Guangxi Key Laboratory of Optoelectroric Information Processing (GD18205), Zhejiang Provincial Natural Science Foundation of China (LY17E050014), China Postdoctoral Science Foundation (2017M621928), Zhejiang Key Discipline of Instrument Science and Technology (JL150508). Publisher Copyright: {\textcopyright} COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; Optical Design and Testing IX 2019 ; Conference date: 21-10-2019 Through 22-10-2019",
year = "2019",
doi = "10.1117/12.2537148",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Yongtian Wang and Pablo Benitez and Osamu Matoba",
booktitle = "Optical Design and Testing IX",
}