Abstract
An instantaneous phase shifting deflectometry measurement method is presented and implemented by measuring a time varying deformable mirror with an iPhone® 6. The instantaneous method is based on multiplexing phase shifted fringe patterns with color, and decomposing them in x and y using Fourier techniques. Along with experimental data showing the capabilities of the instantaneous deflectometry system, a quantitative comparison with the Fourier transform profilometry method, which is a distinct phase measuring method from the phase shifting approach, is presented. Sources of error, nonlinear color-multiplexing induced error correction, and hardware limitations are discussed.
Original language | English (US) |
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Pages (from-to) | 27993-28007 |
Number of pages | 15 |
Journal | Optics Express |
Volume | 24 |
Issue number | 24 |
DOIs | |
State | Published - Nov 28 2016 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
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Instantaneous phase shifting deflectometry
Trumper, I. (Creator), Choi, H. (Contributor) & Kim, D. W. (Creator), figshare, 2016
DOI: 10.6084/m9.figshare.c.3766289.v1, https://figshare.com/collections/Instantaneous_phase_shifting_deflectometry/3766289/1
Dataset
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Instantaneous phase shifting deflectometry
Trumper, I. (Creator), Choi, H. (Contributor) & Kim, D. W. (Creator), figshare, 2016
DOI: 10.6084/m9.figshare.c.3766289, https://figshare.com/collections/Instantaneous_phase_shifting_deflectometry/3766289
Dataset