Instantaneous phase shifting deflectometry

Isaac Trumper, Heejoo Choi, Dae Wook Kim

Research output: Contribution to journalArticlepeer-review

45 Scopus citations


An instantaneous phase shifting deflectometry measurement method is presented and implemented by measuring a time varying deformable mirror with an iPhone® 6. The instantaneous method is based on multiplexing phase shifted fringe patterns with color, and decomposing them in x and y using Fourier techniques. Along with experimental data showing the capabilities of the instantaneous deflectometry system, a quantitative comparison with the Fourier transform profilometry method, which is a distinct phase measuring method from the phase shifting approach, is presented. Sources of error, nonlinear color-multiplexing induced error correction, and hardware limitations are discussed.

Original languageEnglish (US)
Pages (from-to)27993-28007
Number of pages15
JournalOptics Express
Issue number24
StatePublished - Nov 28 2016

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics


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