@inproceedings{2dad6f0c7025444d88aa5ee30e27f737,
title = "Instantaneous phase mapping deflectometry for dynamic deformable mirror characterization",
abstract = "We present an instantaneous phase mapping deflectometry (PMD) system in the context of measuring a continuous surface deformable mirror (DM). Deflectometry has a high dynamic range, enabling the full range of surfaces generated by the DM to be measured. The recent development of an instantaneous PMD system leverages the simple setup of the PMD system to measure dynamic objects with accuracy similar to an interferometer. To demonstrate the capabilities of this technology, we perform a linearity measurement of the actuator motion in a continuous surface DM, which is critical for closed loop control in adaptive optics applications. We measure the entire set of actuators across the DM as they traverse their full range of motion with a Shack-Hartman wavefront sensor, thereby obtaining the influence function. Given the influence function of each actuator, the DM can produce specific Zernike terms on its surface. We then measure the linearity of the Zernike modes available in the DM software using the instantaneous PMD system. By obtaining the relationship between modes, we can more accurately generate surface profiles composed of Zernike terms. This ability is useful for other dynamic freeform metrology applications that utilize the DM as a null component.",
keywords = "Deflectometry, Deformable Mirror, Dynamic Metrology",
author = "Isaac Trumper and Heejoo Choi and Kim, {Dae Wook}",
note = "Funding Information: The authors would like to thank the members of the LOFT group for their support during the development of this technology. This research was made possible in part by the Technology Research Initiative Fund (TRIF) Optics/Imaging Program, through the College of Optical Sciences at the University of Arizona, the Post-processing of Freeform Optics project supported by the Korea Basic Science Institute, and the II-VI Foundation Block-Gift Program for helping support general deflectometry research in the LOFT group. Publisher Copyright: {\textcopyright} 2017 SPIE.; Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems 2017 ; Conference date: 06-08-2017 Through 10-08-2017",
year = "2017",
month = sep,
day = "7",
doi = "10.1117/12.2272188",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Hull, {Tony B.} and Pascal Hallibert and Kim, {Dae Wook}",
booktitle = "Astronomical Optics",
}