Instantaneous phase mapping deflectometry for dynamic deformable mirror characterization

Isaac Trumper, Heejoo Choi, Dae Wook Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


We present an instantaneous phase mapping deflectometry (PMD) system in the context of measuring a continuous surface deformable mirror (DM). Deflectometry has a high dynamic range, enabling the full range of surfaces generated by the DM to be measured. The recent development of an instantaneous PMD system leverages the simple setup of the PMD system to measure dynamic objects with accuracy similar to an interferometer. To demonstrate the capabilities of this technology, we perform a linearity measurement of the actuator motion in a continuous surface DM, which is critical for closed loop control in adaptive optics applications. We measure the entire set of actuators across the DM as they traverse their full range of motion with a Shack-Hartman wavefront sensor, thereby obtaining the influence function. Given the influence function of each actuator, the DM can produce specific Zernike terms on its surface. We then measure the linearity of the Zernike modes available in the DM software using the instantaneous PMD system. By obtaining the relationship between modes, we can more accurately generate surface profiles composed of Zernike terms. This ability is useful for other dynamic freeform metrology applications that utilize the DM as a null component.

Original languageEnglish (US)
Title of host publicationAstronomical Optics
Subtitle of host publicationDesign, Manufacture, and Test of Space and Ground Systems
EditorsTony B. Hull, Pascal Hallibert, Dae Wook Kim
ISBN (Electronic)9781510612594
StatePublished - Sep 7 2017
EventAstronomical Optics: Design, Manufacture, and Test of Space and Ground Systems 2017 - San Diego, United States
Duration: Aug 6 2017Aug 10 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


OtherAstronomical Optics: Design, Manufacture, and Test of Space and Ground Systems 2017
Country/TerritoryUnited States
CitySan Diego


  • Deflectometry
  • Deformable Mirror
  • Dynamic Metrology

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


Dive into the research topics of 'Instantaneous phase mapping deflectometry for dynamic deformable mirror characterization'. Together they form a unique fingerprint.

Cite this