Infrared reflection-absorption spectroscope using thin film structures

S. J. Finke, G. L. Schrader

Research output: Contribution to journalArticlepeer-review

21 Scopus citations


Infrared reflection-absorption spectroscopy (IRRAS) has been used extensively in the study of adsorbates and thin layers on metal surfaces, but little work has been performed on non-metals due to the low sensitivity which results when these materials are used. In this work, thin film structures consisting of a thin layer of a semiconductor (silicon) on a metal (copper) surface are used to increase the sensitivity of the technique for examining layers of poly(methylmethacrylate).

Original languageEnglish (US)
Pages (from-to)91-96
Number of pages6
JournalSpectrochimica Acta Part A: Molecular Spectroscopy
Issue number1
StatePublished - 1990
Externally publishedYes

ASJC Scopus subject areas

  • General Engineering


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