Abstract
Infrared reflection-absorption spectroscopy (IRRAS) has been used extensively in the study of adsorbates and thin layers on metal surfaces, but little work has been performed on non-metals due to the low sensitivity which results when these materials are used. In this work, thin film structures consisting of a thin layer of a semiconductor (silicon) on a metal (copper) surface are used to increase the sensitivity of the technique for examining layers of poly(methylmethacrylate).
| Original language | English (US) |
|---|---|
| Pages (from-to) | 91-96 |
| Number of pages | 6 |
| Journal | Spectrochimica Acta Part A: Molecular Spectroscopy |
| Volume | 46 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1990 |
| Externally published | Yes |
ASJC Scopus subject areas
- Engineering(all)