Information-theoretic analysis of x-ray photoabsorption based threat detection system for check-point

Yuzhang Lin, Genevieve G. Allouche, James Huang, Amit Ashok, Qian Gong, David Coccarelli, Razvan Ionut Stoian, Michael E. Gehm

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations

Abstract

In this work we present an information-theoretic framework for a systematic study of checkpoint x-ray systems using photoabsorption measurements. Conventional system performance analysis of threat detection systems confounds the effect of the system architecture choice with the performance of a threat detection algorithm. However, our system analysis approach enables a direct comparison of the fundamental performance limits of disparate hardware architectures, independent of the choice of a specific detection algorithm. We compare photoabsorptive measurements from different system architectures to understand the affect of system geometry (angular views) and spectral resolution on the fundamental limits of the system performance.

Original languageEnglish (US)
Title of host publicationAnomaly Detection and Imaging with X-Rays (ADIX)
EditorsMichael E. Gehm, Amit Ashok, Mark A. Neifeld
PublisherSPIE
ISBN (Electronic)9781510600881
DOIs
StatePublished - 2016
EventAnomaly Detection and Imaging with X-Rays (ADIX) Conference - Baltimore, United States
Duration: Apr 19 2016Apr 20 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9847
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherAnomaly Detection and Imaging with X-Rays (ADIX) Conference
Country/TerritoryUnited States
CityBaltimore
Period4/19/164/20/16

Keywords

  • Information Theory
  • Simulation
  • Task-specific Information
  • Thin-sheet threat
  • X-ray Photoabsorption
  • X-ray System Architecture
  • X-ray System Geometry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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