@inproceedings{d47c0ba0122944cf984d562b9dede938,
title = "Influence of Lens and Perspective Distortion on Optical Surface Metrology Instrumentation",
abstract = "For any surface metrology system that obtains measurement with the aid of an imaging system, distortion must be carefully scrutinized. Both intrinsic lens distortion and perspective distortion embed surface error distributions that skew the interpretation of resultant surface maps. Either displaces acquired information due to the imaging process. Here, we quantify the origins of distortion, its modeling philosophy, and the effects of its digital correction procedure. This study includes simulation for lens-distorted systems such as interferometers and perspective-distorted systems such as monoscopic fringe projection profilometry and deflectometry. Summarily, this study hopes to clarify differences in low-order shape between surface metrology instrument measurements in which surface maps were not rectified for distortion.",
keywords = "Deflectometry, Fringe Projection Profilometry, Interferometry, Lens Distortion, Perspective Distortion",
author = "Henry Quach and Joel Berkson and Hyukmo Kang and Heejoo Choi and Daewook Kim",
note = "Publisher Copyright: {\textcopyright} 2022 SPIE.; Optical Manufacturing and Testing XIV 2022 ; Conference date: 22-08-2022 Through 24-08-2022",
year = "2022",
doi = "10.1117/12.2633090",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Daewook Kim and Heejoo Choi and Heidi Ottevaere and Rolf Rascher",
booktitle = "Optical Manufacturing and Testing XIV",
}