Inferring the orientation of texture from polarization parameters

Hannah Noble, Wai Sze Lam, Russell A. Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


It is shown that once the diffusely scattered polarization properties are calibrated, the texture orientation can be calculated directly from diattenuation and retardance. Polarization scattering properties are studied for a rough aluminum surface with one-dimensional rough texture and well-defined orientation. Functions of Mueller matrix elements related to sample orientation about the normal via the arctangent function are investigated. The Mueller matrix bidirectional reflectance distribution function is measured for a linearly sanded aluminum sample. Sinusoidal fits to the Mueller matrix show that the angular orientation of the data can be recovered explicitly from its properties.

Original languageEnglish (US)
Title of host publicationPolarization Science and Remote Sensing IV
StatePublished - 2009
EventPolarization Science and Remote Sensing IV - San Diego, CA, United States
Duration: Aug 3 2009Aug 4 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherPolarization Science and Remote Sensing IV
Country/TerritoryUnited States
CitySan Diego, CA


  • BRDF
  • Polarimetry
  • Polarization
  • Scattering

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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