@inproceedings{2756c488589046fa8a4d02ebe17b7473,
title = "Inferring the orientation of texture from polarization parameters",
abstract = "It is shown that once the diffusely scattered polarization properties are calibrated, the texture orientation can be calculated directly from diattenuation and retardance. Polarization scattering properties are studied for a rough aluminum surface with one-dimensional rough texture and well-defined orientation. Functions of Mueller matrix elements related to sample orientation about the normal via the arctangent function are investigated. The Mueller matrix bidirectional reflectance distribution function is measured for a linearly sanded aluminum sample. Sinusoidal fits to the Mueller matrix show that the angular orientation of the data can be recovered explicitly from its properties.",
keywords = "BRDF, Polarimetry, Polarization, Scattering",
author = "Hannah Noble and Lam, {Wai Sze} and Chipman, {Russell A.}",
year = "2009",
doi = "10.1117/12.828261",
language = "English (US)",
isbn = "9780819477514",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Polarization Science and Remote Sensing IV",
note = "Polarization Science and Remote Sensing IV ; Conference date: 03-08-2009 Through 04-08-2009",
}