TY - JOUR
T1 - In-line Spectral Interferometry in Shortwave-Infrared Laser Filaments in Air
AU - Ren, Xiaoming
AU - Wang, Yang
AU - Chang, Zenghu
AU - Welch, James
AU - Bernstein, Aaron
AU - Downer, Michael
AU - Brown, Jeffrey
AU - Gaarde, Mette
AU - Couairon, Arnaud
AU - Kolesik, Miroslav
AU - Polynkin, Pavel
PY - 2019/11/29
Y1 - 2019/11/29
N2 - We investigate the nonlinear propagation of intense, two-cycle, carrier-envelope phase (CEP) stable laser pulses at 1.7 μm center wavelength in air. We observe CEP-dependent spectral interference in the visible part of the forward-propagating white light generated on propagation. The effect is robust against large fluctuations of the input pulse energy. This robustness is enabled by rigid clamping of both the peak optical field and the phase of the propagating waveform, which has been revealed by numerical simulations. The CEP locking can enhance the yield of the CEP-dependent strong-field processes in gaseous media with long-wavelength drivers, while the observed spectral interference enables single-shot, stand-off CEP metrology in the atmosphere.
AB - We investigate the nonlinear propagation of intense, two-cycle, carrier-envelope phase (CEP) stable laser pulses at 1.7 μm center wavelength in air. We observe CEP-dependent spectral interference in the visible part of the forward-propagating white light generated on propagation. The effect is robust against large fluctuations of the input pulse energy. This robustness is enabled by rigid clamping of both the peak optical field and the phase of the propagating waveform, which has been revealed by numerical simulations. The CEP locking can enhance the yield of the CEP-dependent strong-field processes in gaseous media with long-wavelength drivers, while the observed spectral interference enables single-shot, stand-off CEP metrology in the atmosphere.
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U2 - 10.1103/PhysRevLett.123.223203
DO - 10.1103/PhysRevLett.123.223203
M3 - Article
C2 - 31868407
AN - SCOPUS:85077162414
SN - 0031-9007
VL - 123
SP - 223203
JO - Physical review letters
JF - Physical review letters
IS - 22
ER -