In-flight radiometric calibration of the airborne visible/infrared imaging spectrometer (AVIRIS)

James E. Conel, Robert O. Green, Ronald E. Alley, Carol J. Bruegge, Veronique Carrere, Jack S. Margolis, Gregg Vane, Thomas G. Chrien, Philip N. Slater, Stuart F. Biggar, Phil M. Teillet, Ray D. Jackson, M. Susan Moran

Research output: Contribution to journalConference articlepeer-review

19 Scopus citations

Abstract

A reflectance-based method was used to provide an analysis of the in-flight radiometric performance of AVIRIS. Field spectral reflectance measurements of the surface and extinction measurements of the atmosphere using solar radiation were used as input to atmospheric radiative transfer calculations. Five separate codes were used in the analysis. Four include multiple scattering, and the computed radiances from these for flight conditions were in good agreement. Code-generated radiances were compared with AVIRIS-predicted radiances based on two laboratory calibrations (pre- and post-season of flight) for a uniform highly reflecting natural dry lake target. For one spectrometer (C), the pre- and post-season calibration factors were found to give identical results, and to be in agreement with the atmospheric models that include multiple scattering. This positive result validates the field and laboratory calibration technique. Results for the other spectrometers (A, B and D) were widely at variance with the models no matter which calibration factors were used. Potential causes of these discrepancies are discussed.

Original languageEnglish (US)
Pages (from-to)179-195
Number of pages17
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume924
DOIs
StatePublished - Oct 12 1988
EventRecent Advances in Sensors, Radiometry, and Data Processing for Remote Sensing 1988 - Orlando, United States
Duration: Apr 4 1988Apr 8 1988

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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