In-flight radiometric calibration of ASTER by reference to well-characterized scenes

Philip N. Slater, Stuart F. Biggar, Kurtis J. Thome, David I. Gellman, Paul R. Spyak

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

ASTER will be calibrated in the laboratory by reference to sources traceable to NRLM and NIST standards and through the use of transfer radiometers. Partial aperture on-board calibration systems will be used in the solar-reflective range and an on-board blackbody source will be used in the infrared. An important independent source of calibration data will be provided through the in-flight radiometric calibration of ASTER by reference to well- characterized scenes. The latter is the subject of this paper. Methods that make use of ground reflectance and radiance measurements made simultaneously with atmospheric measurements at selected sites and used as input to radiative transfer codes are described. The results of error analyses are presented indicating that, depending on the method used, the predicted uncertainties fall between ± 2.8% and ± 4.9%, for the solar-reflective range. In the thermal infrared, the goal is an uncertainty of less than 1 K. A method that provides in-flight cross calibrations with other sensors also is described.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages49-60
Number of pages12
ISBN (Print)0819416479
StatePublished - 1995
EventPlatforms and Systems - Rome, Italy
Duration: Sep 6 1994Sep 6 1994

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2317
ISSN (Print)0277-786X

Other

OtherPlatforms and Systems
CityRome, Italy
Period9/6/949/6/94

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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