Improving performance of PEM-based partial Mueller matrix polarimeters

Farhana Bashar, Joseph Kurtz, Andrey S. Alenin, J. Scott Tyo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Recently we have presented theoretical predictions and numerical modeling that show that a more advanced processing scheme can significantly improve the performance of photoelastic modulator (PEM)-based Mueller polarimeters. Of note, by simply including all of the multi-carrier harmonics rather than a hand-selected subset thereof, the sensitivity of the system can be enhanced by up to a factor of six in certain elements of the Mueller matrix. This paper extends our work on PEM-based Mueller polarimeters to PEM-based partial Mueller systems with 2 PEMs, one PEM each in the generator and analyser. Our findings clearly demonstrates significant performance improvement through the use of a substantially large set of multi-carrier harmonics rather than a hand-selected subset. We also present results from our experimental PEM testbed system that verifies the numerical findings.

Original languageEnglish (US)
Title of host publicationPolarization Science and Remote Sensing IX
EditorsJulia M. Craven, Joseph A. Shaw, Frans Snik
PublisherSPIE
ISBN (Electronic)9781510629578
DOIs
StatePublished - 2019
Externally publishedYes
EventPolarization Science and Remote Sensing IX 2019 - San Diego, United States
Duration: Aug 14 2019Aug 15 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11132
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferencePolarization Science and Remote Sensing IX 2019
Country/TerritoryUnited States
CitySan Diego
Period8/14/198/15/19

Keywords

  • Partial Mueller Matrix
  • PEM-based Polarimeters
  • Polarization

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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