Improvement of detected intensity in confocal microscopy by using reflecting optical system

Dong Kyun Kang; Jung Woo Seo; Dae Gab Gweon

doi:10.1063/1.1638895

Improvement of detected intensity in confocal microscopy by using reflecting optical system

Dong Kyun Kang, Jung Woo Seo, Dae Gab Gweon

Research output: Contribution to journal › Article › peer-review

Abstract

A reflecting optical system to improve the detected intensity in confocal microscopy was described. The result of the optical design was discussed and the performance of the system was evaluated. A numerical simulation study was also carried out. A standard specimen was imaged to describe the benefits of the system. Results show a 37% increase in the detected intensity.

Original language	English (US)
Pages (from-to)	550-552
Number of pages	3
Journal	Review of Scientific Instruments
Volume	75
Issue number	2
DOIs	https://doi.org/10.1063/1.1638895
State	Published - Feb 2004
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1638895

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title = "Improvement of detected intensity in confocal microscopy by using reflecting optical system",

abstract = "A reflecting optical system to improve the detected intensity in confocal microscopy was described. The result of the optical design was discussed and the performance of the system was evaluated. A numerical simulation study was also carried out. A standard specimen was imaged to describe the benefits of the system. Results show a 37% increase in the detected intensity.",

author = "Kang, {Dong Kyun} and Seo, {Jung Woo} and Gweon, {Dae Gab}",

year = "2004",

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AB - A reflecting optical system to improve the detected intensity in confocal microscopy was described. The result of the optical design was discussed and the performance of the system was evaluated. A numerical simulation study was also carried out. A standard specimen was imaged to describe the benefits of the system. Results show a 37% increase in the detected intensity.

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Improvement of detected intensity in confocal microscopy by using reflecting optical system

Abstract

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