Abstract
Acoustic microscopes can be used to measure Rayleigh and longitudinal or P-wave speeds in a specimen at microscopic resolution. The wave speeds are obtained from the interference pattern as a function of the defocus distance or V(z) curve. The received signal voltage amplitude Vis generated by two beams - the normally reflected central beam and a non-specularly reflected beam that strikes the fluid-solid interface at critical angle. It is shown in this paper that instead of analyzing the interference pattern between these two beams if we consider two other beams that follow the same path but travel through the coupling fluid multiple times before interfering then the V(z) curve generated by this higher order interference gives more accurate values for the material properties. The spacing distance between two successive dips of the V(z) curve is smaller for the higher order interference. The higher order interference, although weaker, gives more accurate results. Justification for the greater accuracy of the higher order interference is given in the paper. Material properties of silicon and bone are obtained by the new technique.
Original language | English (US) |
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Pages | 99-105 |
Number of pages | 7 |
State | Published - 2001 |
Event | Proceedings of the 7th ASME NDE Tropical Conference - 2001 - San Antonio, TX, United States Duration: Apr 23 2001 → Apr 25 2001 |
Other
Other | Proceedings of the 7th ASME NDE Tropical Conference - 2001 |
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Country/Territory | United States |
City | San Antonio, TX |
Period | 4/23/01 → 4/25/01 |
ASJC Scopus subject areas
- Mechanical Engineering