IMEC clean: A new concept for particle and metal removal on Si surfaces

  • M. Meuris
  • , P. W. Mertens
  • , A. Opdebeeck
  • , H. F. Schmidt
  • , M. Depas
  • , G. Vereecke
  • , M. M. Heyns
  • , A. Philipossian

Research output: Contribution to specialist publicationArticle

64 Scopus citations

Abstract

This article describes the IMEC clean concept, a simple two-step cleaning method based on oxidation and oxide removal. This clean has excellent particle and metal removal efficiencies and minimal surface roughening. Electrical breakdown measurements show very good gate-oxide integrity as well.

Original languageEnglish (US)
Volume38
No7
Specialist publicationSolid State Technology
StatePublished - Jul 1995

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'IMEC clean: A new concept for particle and metal removal on Si surfaces'. Together they form a unique fingerprint.

Cite this