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Imaging properties of extended depth of field microscopy through single-shot focus scanning
Sheng Huei Lu,
Hong Hua
Optical Sciences
Computer Science
Electrical and Computer Engineering
Research output
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Contribution to journal
›
Article
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peer-review
27
Scopus citations
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Engineering
Restored Image
100%
Limitations
50%
Signal-to-Noise Ratio
50%
Analytical Model
50%
Field System
50%
System Response
50%
Field Image
50%
Keyphrases
Focus Scanning
100%
Field Microscopy
100%
Physics
Signal-to-Noise Ratio
100%