Imaging electron interferometer

A. C. Bleszynski, K. E. Aidala, B. J. Leroy, R. M. Westervelt, E. J. Heller, K. D. Maranowski, A. C. Gossard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An imaging electron interferometer was created in a two-dimensional electron gas (2DEG) using a liquid-He cooled scanning probe microscope (SPM). Electron waves emitted from a quantum point contact (QPC) return to the QPC along two paths: reflection from a concave mirror formed by a gate, and backscattering from the depleted disc underneath the charged SPM tip. Interference of these waves when they return to the QPC produces strong interference fringes in images of electron flow. A quantum phase shifter is formed by moving the mirror via its gate voltage - the fringes move a corresponding amount. The coherent fringes are robust to thermal averaging when the lengths of the two paths are within lT = vF/πk BT of each other.

Original languageEnglish (US)
Title of host publicationPHYSICS OF SEMICONDUCTORS
Subtitle of host publication27th International Conference on the Physics of Semiconductors, ICPS-27
Pages1461-1462
Number of pages2
DOIs
StatePublished - Jun 30 2005
Externally publishedYes
EventPHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 - Flagstaff, AZ, United States
Duration: Jul 26 2004Jul 30 2004

Publication series

NameAIP Conference Proceedings
Volume772
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherPHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27
Country/TerritoryUnited States
CityFlagstaff, AZ
Period7/26/047/30/04

ASJC Scopus subject areas

  • General Physics and Astronomy

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