Image processing methods to compensate for IFOV errors in microgrid imaging polarimeters

Bradley M. Ratliff, James K. Boger, Matthew P. Fetrow, J. Scott Tyo, Wiley T. Black

Research output: Chapter in Book/Report/Conference proceedingConference contribution

32 Scopus citations


Long-wave infrared imaging Stokes vector polarimeters are used in many remote sensing applications. Imaging polarimeters require that several measurements be made under optically different conditions in order to estimate the polarization signature at a given scene point. This multiple-measurement requirement introduces error in the signature estimates, and the errors differ depending upon the type of measurement scheme used. Here, we investigate a LWIR linear microgrid polarimeter. This type of instrument consists of a mosaic of micropolarizers at different orientations that are masked directly onto a focal plane array sensor. In this scheme, each polarization measurement is acquired spatially and hence each is made at a different point in the scene. This is a significant source of error, as it violates the requirement that each polarization measurement have the same instantaneous field-of-view (IFOV). In this paper, we first study the amount of error introduced by the IFOV handicap in microgrid instruments. We then proceed to investigate means for mitigating the effects of these errors to improve the quality of polarimetric imagery. In particular, we examine different interpolation schemes and gauge their performance. These studies are completed through the use of both real instrumental and modeled data.

Original languageEnglish (US)
Title of host publicationPolarization
Subtitle of host publicationMeasurement, Analysis, and Remote Sensing VII
StatePublished - 2006
Externally publishedYes
EventPolarization: Measurement, Analysis, and Remote Sensing VII - Kissimmee, FL, United States
Duration: Apr 20 2006Apr 21 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherPolarization: Measurement, Analysis, and Remote Sensing VII
Country/TerritoryUnited States
CityKissimmee, FL


  • Focal Plane Array
  • Image Processing
  • Long-wave Infrared
  • Microgrid
  • Polarimeter
  • Polarimetry
  • Remote Sensing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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