Abstract
An image of a straight edge in confocal self-interference microscopy (CSIM) is analyzed. Simulations of edge images based on a two-dimensional imaging equation are presented that show a 103% increase in edge gradient and a 43.1% decrease in the 10–90% width. The first experimental results, to our knowledge, for CSIM are presented and show good agreement with the simulation results and a 23% decrease in the 10–90% width.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1650-1652 |
| Number of pages | 3 |
| Journal | Optics letters |
| Volume | 30 |
| Issue number | 13 |
| DOIs | |
| State | Published - Jul 1 2005 |
| Externally published | Yes |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics