TY - GEN
T1 - Image classification based on focus
AU - Patel, Mehul B.
AU - Rodriguez, Jeffrey J.
AU - Gmitro, Arthur F.
PY - 2008
Y1 - 2008
N2 - The performance of most image classification algorithms deteriorates in the presence of out-of-focus blur. Thus, it is essential to either correct the focus of the input images or leave them out of the training set. There exist many focus metrics for auto-focusing, but they generally give a relative focus value. Our technique combines some of the best performing focus metrics to obtain a new focus measure using which we can separate in-focus images from out-of-focus ones. We also compare our technique with the existing ones and show that it performs better. The classifier was tested on a dataset of ovarian images obtained using confocal microendoscopy.
AB - The performance of most image classification algorithms deteriorates in the presence of out-of-focus blur. Thus, it is essential to either correct the focus of the input images or leave them out of the training set. There exist many focus metrics for auto-focusing, but they generally give a relative focus value. Our technique combines some of the best performing focus metrics to obtain a new focus measure using which we can separate in-focus images from out-of-focus ones. We also compare our technique with the existing ones and show that it performs better. The classifier was tested on a dataset of ovarian images obtained using confocal microendoscopy.
KW - Focus detection
KW - Image classification
UR - http://www.scopus.com/inward/record.url?scp=69949167694&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=69949167694&partnerID=8YFLogxK
U2 - 10.1109/ICIP.2008.4711775
DO - 10.1109/ICIP.2008.4711775
M3 - Conference contribution
AN - SCOPUS:69949167694
SN - 1424417643
SN - 9781424417643
T3 - Proceedings - International Conference on Image Processing, ICIP
SP - 397
EP - 400
BT - 2008 IEEE International Conference on Image Processing, ICIP 2008 Proceedings
T2 - 2008 IEEE International Conference on Image Processing, ICIP 2008
Y2 - 12 October 2008 through 15 October 2008
ER -