TY - GEN
T1 - Hot spots and core-to-core thermal coupling in future multi-core architectures
AU - Janicki, M.
AU - Collet, J. H.
AU - Louri, A.
AU - Napieralski, A.
PY - 2010
Y1 - 2010
N2 - This paper studies hot spot and thermal coupling problems in future multicore architectures as CMOS technology scales from 65 nm feature size to 15 nm. We demonstrate that the thermal coupling between neighboring cores will dramatically increase as the technology scales to smaller feature sizes. The simulation studies were based on solving the heat equation using the analytical Green's function method. Our simulations indicate that the thermal coupling in the 15 nm feature size just after 100 ms of operation will increase from 20 % to 42 % and in the steady state might reach even 65 %. This finding uncovers a major challenge for the design of future multi-core architectures as the technology keeps scaling down. This will require a holistic approach to the design of future multi-core architectures encompassing low power computing, thermal management technologies and workload distribution.
AB - This paper studies hot spot and thermal coupling problems in future multicore architectures as CMOS technology scales from 65 nm feature size to 15 nm. We demonstrate that the thermal coupling between neighboring cores will dramatically increase as the technology scales to smaller feature sizes. The simulation studies were based on solving the heat equation using the analytical Green's function method. Our simulations indicate that the thermal coupling in the 15 nm feature size just after 100 ms of operation will increase from 20 % to 42 % and in the steady state might reach even 65 %. This finding uncovers a major challenge for the design of future multi-core architectures as the technology keeps scaling down. This will require a holistic approach to the design of future multi-core architectures encompassing low power computing, thermal management technologies and workload distribution.
UR - http://www.scopus.com/inward/record.url?scp=77952625037&partnerID=8YFLogxK
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U2 - 10.1109/STHERM.2010.5444291
DO - 10.1109/STHERM.2010.5444291
M3 - Conference contribution
AN - SCOPUS:77952625037
SN - 9781424464586
T3 - Annual IEEE Semiconductor Thermal Measurement and Management Symposium
SP - 205
EP - 209
BT - 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2010 - Proceedings 2010
T2 - 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2010
Y2 - 21 February 2010 through 25 February 2010
ER -