Abstract
Recent advances in multielement solid‐state detector systems for high rate, high resolution x‐ray spectroscopy at noncryogenic temperatures will be described in this paper. A 16‐channel silicon detector system, designed and built at BNL, has been recently operated in the NSLS machine beam ♯X19A, showing an average energy resolution of less than 250 eV FWHM, which is adequate to discriminate the fluorescence trace element against the background of elastically scattered photons in a typical EXAFS application. A larger, 128 channel system, will soon permit a higher overall count rate: ≳106 counts per second. It is shown that, in order to achieve high resolution with a solid‐state detector, special care must be spent in the detector‐preamplifier assembly. A low noise detectorpreamplifier may be obtained integrating the front‐end devices (an FET and/or a feedback capacitor) with the detector itself.
Original language | English (US) |
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Pages (from-to) | 3360 |
Number of pages | 1 |
Journal | Review of Scientific Instruments |
Volume | 67 |
Issue number | 9 |
DOIs | |
State | Published - Sep 1996 |
Externally published | Yes |
Keywords
- BNL
- DESIGN
- ENERGY RESOLUTION
- FABRICATION
- NSLS
- SI SEMICONDUCTOR DETECTORS
- SYNCHROTRON RADIATION
- X−RAY EQUIPMENT
- X−RAY SPECTROSCOPY
ASJC Scopus subject areas
- Instrumentation