Abstract
A high speed Mueller matrix imaging polarimeter is presented. The instrument enables measurement of the full Mueller matrix in transmission, reflection, or retro-reflection. The Mueller matrix provides a complete description of the polarization transforming properties of the sample. The retardance, diattenuation, polarizance, and depolarization are all characterized by the polarimeter. The polarimeter is able to measure the polarization properties of samples ranging from sub-millimeter optical components to large optics. The imaging capabilities can be modified to measure the polarization properties across the surface of the sample or as a function of the angle through the sample. The dual rotating retarder polarimeter provides up to sixty-two full Mueller matrix images per second. Instrument details, measurement techniques, example data, and applications are presented.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 24-32 |
| Number of pages | 9 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 5158 |
| DOIs | |
| State | Published - 2003 |
| Event | Polarization Science and Remote Sensing - San Diego, CA, United States Duration: Aug 3 2003 → Aug 5 2003 |
Keywords
- Imaging polarimeter
- Mueller matrix
- Polarimetry
- Polarization
- Polarization aberrations
- Polarization metrology
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering