High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators

Elizabeth A. Sornsin; Russell A. Chipman

doi:10.1117/12.271437

High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators

Elizabeth A. Sornsin, Russell A. Chipman

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

A thin-film lead-lanthanum-zirconate-titanate (PLZT) electro-optic spatial light modulator has been characterized with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in the PLZT 9/65/35 material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2×10^-16 (m/V)² was determined in the modulator active regions.

Original language	English (US)
Pages (from-to)	373-378
Number of pages	6
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3008
DOIs	https://doi.org/10.1117/12.271437
State	Published - 1997
Externally published	Yes
Event	Miniaturized Systems with Micro-Optics and Micromechanics II - San Jose, CA, United States Duration: Feb 10 1997 → Feb 12 1997

Keywords

Imaging polarimetry
Mueller matrix
PLZT
Retardance

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.271437

Cite this

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title = "High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators",

abstract = "A thin-film lead-lanthanum-zirconate-titanate (PLZT) electro-optic spatial light modulator has been characterized with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in the PLZT 9/65/35 material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2×10-16 (m/V)2 was determined in the modulator active regions.",

keywords = "Imaging polarimetry, Mueller matrix, PLZT, Retardance",

author = "Sornsin, {Elizabeth A.} and Chipman, {Russell A.}",

year = "1997",

doi = "10.1117/12.271437",

language = "English (US)",

volume = "3008",

pages = "373--378",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Miniaturized Systems with Micro-Optics and Micromechanics II ; Conference date: 10-02-1997 Through 12-02-1997",

}

TY - JOUR

T1 - High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators

AU - Sornsin, Elizabeth A.

AU - Chipman, Russell A.

PY - 1997

Y1 - 1997

N2 - A thin-film lead-lanthanum-zirconate-titanate (PLZT) electro-optic spatial light modulator has been characterized with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in the PLZT 9/65/35 material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2×10-16 (m/V)2 was determined in the modulator active regions.

AB - A thin-film lead-lanthanum-zirconate-titanate (PLZT) electro-optic spatial light modulator has been characterized with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in the PLZT 9/65/35 material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2×10-16 (m/V)2 was determined in the modulator active regions.

KW - Imaging polarimetry

KW - Mueller matrix

KW - PLZT

KW - Retardance

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U2 - 10.1117/12.271437

DO - 10.1117/12.271437

M3 - Conference article

AN - SCOPUS:0031389514

SN - 0277-786X

VL - 3008

SP - 373

EP - 378

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Miniaturized Systems with Micro-Optics and Micromechanics II

Y2 - 10 February 1997 through 12 February 1997

ER -

High-resolution Mueller matrix polarimetry of thin-film PLZT electro-optic modulators

Abstract

Keywords

ASJC Scopus subject areas

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