TY - GEN
T1 - High frequency characterization of carbon nanotube films
AU - Wu, Ziran
AU - Wang, Lu
AU - Xin, Hao
PY - 2008
Y1 - 2008
N2 - Carbon nanotube films are characterized using Vector Network Analyzer (VNA) and Terahertz Time-Domain Spectroscopy (THz-TDS). Both transmission and reflection experiments are performed in order to measure the complex refractive index and the wave impedance. This method allows simultaneous extraction of both the permittivity and permeability without any assumptions. Experimental results are obtained from microwave to THz for various multi-walled and single-walled nanotube samples.
AB - Carbon nanotube films are characterized using Vector Network Analyzer (VNA) and Terahertz Time-Domain Spectroscopy (THz-TDS). Both transmission and reflection experiments are performed in order to measure the complex refractive index and the wave impedance. This method allows simultaneous extraction of both the permittivity and permeability without any assumptions. Experimental results are obtained from microwave to THz for various multi-walled and single-walled nanotube samples.
UR - https://www.scopus.com/pages/publications/58049118110
UR - https://www.scopus.com/pages/publications/58049118110#tab=citedBy
U2 - 10.1109/ICIMW.2008.4665477
DO - 10.1109/ICIMW.2008.4665477
M3 - Conference contribution
AN - SCOPUS:58049118110
SN - 9781424421206
T3 - 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
BT - 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
T2 - 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
Y2 - 15 September 2008 through 19 September 2008
ER -