High Contrast Imaging at the Photon Noise Limit with WFS-based PSF Calibration

Olivier Guyon, Barnaby Norris, Marc Antoine Martinod, Kyohoon Ahn, Vincent Deo, Nour Skaf, Julien Lozi, Sébastien Vievard, Sebastiaan Y. Haffert, Thayne Currie, Jared R. Males, Alison Wong, Peter Tuthill

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Speckle Noise is the dominant source of error in high contrast imaging with adaptive optics system. We discuss the potential for wavefront sensing telemetry to calibrate speckle noise with sufficient precision and accuracy so that it can be removed in post-processing of science images acquired by high contrast imaging instruments. In such a self-calibrating system, exoplanet detection would be limited by photon noise and be significantly more robust and efficient than in current systems. We show initial laboratory and on-sky tests, demonstrating over short timescale that residual speckle noise is indeed calibrated to an accuracy exceeding readout and photon noise in the high contrast region. We discuss immplications for the design of space and ground high-contrast imaging systems.

Original languageEnglish (US)
Title of host publicationAdaptive Optics Systems VIII
EditorsLaura Schreiber, Dirk Schmidt, Elise Vernet
PublisherSPIE
ISBN (Electronic)9781510653511
DOIs
StatePublished - 2022
EventAdaptive Optics Systems VIII 2022 - Montreal, Canada
Duration: Jul 17 2022Jul 22 2022

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12185
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAdaptive Optics Systems VIII 2022
Country/TerritoryCanada
CityMontreal
Period7/17/227/22/22

Keywords

  • Adaptive Optics
  • Coronagraphy
  • Exoplanets
  • High Contrast Imaging
  • Image Procesing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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