Gemini planet imager observational calibrations III: Empirical measurement methods and applications of high-resolution microlens PSFs

Patrick Ingraham; Jean Baptiste Ruffio; Marshall D. Perrin; Schuyler G. Wolff; Zachary H. Draper; Jerome Maire; Franck Marchis; Vincent Fesquet

doi:10.1117/12.2055283

Gemini planet imager observational calibrations III: Empirical measurement methods and applications of high-resolution microlens PSFs

Patrick Ingraham, Jean Baptiste Ruffio, Marshall D. Perrin, Schuyler G. Wolff, Zachary H. Draper, Jerome Maire, Franck Marchis, Vincent Fesquet

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

11 Scopus citations

Abstract

The newly commissioned Gemini Planet Imager (GPI) combines extreme adaptive optics, an advanced coronagraph, precision wavefront control and a lenslet-based integral field spectrograph (IFS) to measure the spectra of young extrasolar giant planets between 0.9-2.5 μm. Each GPI detector image, when in spectral model, consists of ∼37,000 microspectra which are under or critically sampled in the spatial direction. This paper demonstrates how to obtain high-resolution microlens PSFs and discusses their use in enhancing the wavelength calibration, flexure compensation and spectral extraction. This method is generally applicable to any lenslet-based integral field spectrograph including proposed future instrument concepts for space missions.

Original language	English (US)
Title of host publication	Ground-Based and Airborne Instrumentation for Astronomy V
Editors	Suzanne K. Ramsay, Ian S. McLean, Hideki Takami
Publisher	SPIE
ISBN (Electronic)	9780819496157
DOIs	https://doi.org/10.1117/12.2055283
State	Published - 2014
Externally published	Yes
Event	Ground-Based and Airborne Instrumentation for Astronomy V - Montreal, Canada Duration: Jun 22 2014 → Jun 26 2014

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9147
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Other

Other	Ground-Based and Airborne Instrumentation for Astronomy V
Country/Territory	Canada
City	Montreal
Period	6/22/14 → 6/26/14

Keywords

Extrasolar planets
High Contrast Imaging
Infrared Detectors
Integral field spectrograph
data reduction

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2055283

Cite this

Ingraham, P., Ruffio, J. B., Perrin, M. D., Wolff, S. G., Draper, Z. H., Maire, J., Marchis, F., & Fesquet, V. (2014). Gemini planet imager observational calibrations III: Empirical measurement methods and applications of high-resolution microlens PSFs. In S. K. Ramsay, I. S. McLean, & H. Takami (Eds.), Ground-Based and Airborne Instrumentation for Astronomy V Article 91477K (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9147). SPIE. https://doi.org/10.1117/12.2055283

Gemini planet imager observational calibrations III: Empirical measurement methods and applications of high-resolution microlens PSFs. / Ingraham, Patrick; Ruffio, Jean Baptiste; Perrin, Marshall D. et al.
Ground-Based and Airborne Instrumentation for Astronomy V. ed. / Suzanne K. Ramsay; Ian S. McLean; Hideki Takami. SPIE, 2014. 91477K (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9147).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ingraham, P, Ruffio, JB, Perrin, MD, Wolff, SG, Draper, ZH, Maire, J, Marchis, F & Fesquet, V 2014, Gemini planet imager observational calibrations III: Empirical measurement methods and applications of high-resolution microlens PSFs. in SK Ramsay, IS McLean & H Takami (eds), Ground-Based and Airborne Instrumentation for Astronomy V., 91477K, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9147, SPIE, Ground-Based and Airborne Instrumentation for Astronomy V, Montreal, Canada, 6/22/14. https://doi.org/10.1117/12.2055283

Ingraham P, Ruffio JB, Perrin MD, Wolff SG, Draper ZH, Maire J et al. Gemini planet imager observational calibrations III: Empirical measurement methods and applications of high-resolution microlens PSFs. In Ramsay SK, McLean IS, Takami H, editors, Ground-Based and Airborne Instrumentation for Astronomy V. SPIE. 2014. 91477K. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2055283

Ingraham, Patrick ; Ruffio, Jean Baptiste ; Perrin, Marshall D. et al. / Gemini planet imager observational calibrations III : Empirical measurement methods and applications of high-resolution microlens PSFs. Ground-Based and Airborne Instrumentation for Astronomy V. editor / Suzanne K. Ramsay ; Ian S. McLean ; Hideki Takami. SPIE, 2014. (Proceedings of SPIE - The International Society for Optical Engineering).

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Gemini planet imager observational calibrations III: Empirical measurement methods and applications of high-resolution microlens PSFs

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Keywords

ASJC Scopus subject areas

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