Abstract
To reduce the environmental errors, a snapshot phase-shifting interference microscope (SPSIM) has been developed for surface roughness measurement. However, fringe-print-through (FPT) error widely exists in the phase-shifting interferometry (PSI). To ensure the measurement accuracy, we analyze the sources which introduce the FPT error in the SPSIM. We also develop a FPT error correction algorithm which can be used in the different intensity distribution conditions. The simulation and experiment verify the correctness and feasibility of the FPT error correction algorithm.
Original language | English (US) |
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Pages (from-to) | 26554-26566 |
Number of pages | 13 |
Journal | Optics Express |
Volume | 25 |
Issue number | 22 |
DOIs | |
State | Published - Oct 30 2017 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics