Frequency-domain scene-based non-uniformity correction and application to microgrid polarimeters

Wiley T. Black, Charles F. LaCasse IV, J. Scott Tyo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Non-uniformity noise is common in infrared imagers, and is usually corrected through calibration, often by momentarily blocking the optical system with a relatively uniform temperature plate. The non-uniformity patterns also tend to drift and require periodic recalibration, necessitating occasional loss of video from the imager during the recalibration process. Microgrid polarimeters are especially sensitive to fixed-pattern noise because the polarization signal is acquired by differentiation of neighboring pixels. Scene-based algorithms attempt to alleviate the need for recalibration of the imager through image processing techniques. We introduce a new frequency-domain scene-based non-uniformity estimation and correction technique, and apply the technique to infrared and microgrid polarimeter imagery. The technique demonstrates promising results for shutter-assisted (recalibration) video, for microgrid polarization systems as well as most spatially modulated sensor systems.

Original languageEnglish (US)
Title of host publicationPolarization Science and Remote Sensing V
DOIs
StatePublished - 2011
EventPolarization Science and Remote Sensing V - San Diego, CA, United States
Duration: Aug 21 2011Aug 22 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8160
ISSN (Print)0277-786X

Other

OtherPolarization Science and Remote Sensing V
Country/TerritoryUnited States
CitySan Diego, CA
Period8/21/118/22/11

Keywords

  • Fixed-Pattern Noise
  • Long-wave infrared
  • Microgrid
  • Polarimetry
  • Scene-Based Non-Uniformity Correction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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