Freeze-etching and vapor matrix deposition for ToF-SIMS imaging of single cells

Engineering & Materials Science

• Secondary ion mass spectrometry 100%
• Etching 71%
• Vapors 59%
• Imaging techniques 50%
• Molecules 43%
• Vacuum 39%
• Ion bombardment 35%
• Sublimation 31%
• Surface waters 30%
• Ionization 28%
• Electron microscopy 28%
• Cryogenics 23%
• Temperature 8%

Physics & Astronomy

• secondary ion mass spectrometry 68%
• etching 50%
• vapors 50%
• water 37%
• matrices 36%
• cells 35%
• bombardment 31%
• vacuum 21%
• surface water 19%
• sublimation 18%
• molecules 17%
• cryogenics 15%
• surface layers 14%
• electron microscopy 14%
• fragments 14%
• methodology 13%
• spatial resolution 13%
• preparation 12%
• ionization 11%
• ions 7%

Chemical Compounds

• Time-of-Flight Secondary Ion Mass Spectrometry 80%
• Vacuum 35%
• Ion Bombardment 28%
• Cluster Ion 26%
• Sublimation 25%
• Environment 25%
• Cryogenics 24%
• Surface Water 23%
• Surface 21%
• Electron Microscopy 19%
• Sample Preparation 18%
• Ionization 17%
• Molecule 15%