Freeform surface characterization and instrument alignment for freeform space applications

  • Manal Khreishi
  • , Raymond Ohl
  • , Joseph Howard
  • , Jonathan Papa
  • , Clark Hovis
  • , Andrew Howe
  • , Theodore Hadjimichael
  • , Patrick Thompson
  • , Ron Shiri
  • , Garrett West
  • , Adam Phenis
  • , Rongguang Liang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

CMM metrology provides simple, 3D surface data used for prescription retrieval, figure error, and alignment with high accuracy without null-correctors. Two freeform mirrors for a compact telescope were successfully characterized and aligned using the CMM.

Original languageEnglish (US)
Title of host publicationFreeform Optics - Proceedings Optical Design and Fabrication 2019 (Freeform, OFT)
PublisherOptical Society of America (OSA)
ISBN (Electronic)9781943580606
DOIs
StatePublished - Jun 3 2019
EventFreeform Optics, Freeform 2019 - Part of Optical Design and Fabrication 2019 - Washington, United States
Duration: Jun 12 2019Jun 12 2019

Publication series

NameFreeform Optics - Proceedings Optical Design and Fabrication 2019 (Freeform, OFT)

Conference

ConferenceFreeform Optics, Freeform 2019 - Part of Optical Design and Fabrication 2019
Country/TerritoryUnited States
CityWashington
Period6/12/196/12/19

ASJC Scopus subject areas

  • Radiology Nuclear Medicine and imaging
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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