Freeform surface characterization and instrument alignment for freeform space applications

Manal Khreishi, Raymond Ohl, Joseph Howard, Jonathan Papa, Clark Hovis, Andrew Howe, Theodore Hadjimichael, Patrick Thompson, Ron Shiri, Garrett West, Adam Phenis, Rongguang Liang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

CMM metrology provides simple, 3D surface data used for prescription retrieval, figure error, and alignment with high accuracy without null-correctors. Two freeform mirrors for a compact telescope were successfully characterized and aligned using the CMM.

Original languageEnglish (US)
Title of host publicationFreeform Optics - Proceedings Optical Design and Fabrication 2019 (Freeform, OFT)
PublisherOptical Society of America (OSA)
ISBN (Electronic)9781943580606
DOIs
StatePublished - Jun 3 2019
EventFreeform Optics, Freeform 2019 - Part of Optical Design and Fabrication 2019 - Washington, United States
Duration: Jun 12 2019Jun 12 2019

Publication series

NameFreeform Optics - Proceedings Optical Design and Fabrication 2019 (Freeform, OFT)

Conference

ConferenceFreeform Optics, Freeform 2019 - Part of Optical Design and Fabrication 2019
Country/TerritoryUnited States
CityWashington
Period6/12/196/12/19

ASJC Scopus subject areas

  • Radiology Nuclear Medicine and imaging
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Fingerprint

Dive into the research topics of 'Freeform surface characterization and instrument alignment for freeform space applications'. Together they form a unique fingerprint.

Cite this