Abstract
We show how FWHM, FW1/e2, Strehl ratio, and encircled energy figures of merit vary with different types of aberration and measurement methods. We examine in detail the array sampling method and the slit-scan method. Our irradiance in the exit pupil of the optical system is a simple Gaussian. We found that in general the slit-scan method and the array method do not yield the same result. The width measurements for the central lobe of the diffraction pattern are very insensitive to aberration.
Original language | English (US) |
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Pages (from-to) | 79-85 |
Number of pages | 7 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 1834 |
DOIs | |
State | Published - Apr 22 1993 |
Event | Laser Energy Distribution Profiles: Measurement and Applications 1992 - Boston, United States Duration: Nov 16 1992 → … |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering