@inproceedings{b87951bd2a7549c2a18c420a840742c6,
title = "Field-portable nanoparticle and virus sizing enabled by on-chip microscopy and vapor-condensed nanolenses",
abstract = "Vapor-condensed nanolenses make label-free lensfree holographic microscopy sensitive to individual particles 40 nm and larger. Detected signals correlate with particle size with accuracy ±11 nm. Automated image processing measures >105 particles within a single field-of-view.",
keywords = "Atmospheric measurements, Measurement uncertainty, Microscopy, Nanoparticles, Particle measurements, Size measurement, System-on-chip",
author = "Euan McLeod and Dincer, {T. Umut} and Muhammed Veli and Ertas, {Yavuz N.} and Chau Nguyen and Wei Luo and Alon Greenbaum and Alborz Feizi and Aydogan Ozcan",
note = "Publisher Copyright: {\textcopyright} 2015 OSA.; Conference on Lasers and Electro-Optics, CLEO 2015 ; Conference date: 10-05-2015 Through 15-05-2015",
year = "2015",
month = aug,
day = "10",
language = "English (US)",
series = "Conference on Lasers and Electro-Optics Europe - Technical Digest",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2015 Conference on Lasers and Electro-Optics, CLEO 2015",
}