Field-portable nanoparticle and virus sizing enabled by on-chip microscopy and vapor-condensed nanolenses

Euan McLeod, T. Umut Dincer, Muhammed Veli, Yavuz N. Ertas, Chau Nguyen, Wei Luo, Alon Greenbaum, Alborz Feizi, Aydogan Ozcan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Vapor-condensed nanolenses make label-free lensfree holographic microscopy sensitive to individual particles 40 nm and larger. Detected signals correlate with particle size with accuracy ±11 nm. Automated image processing measures >105 particles within a single field-of-view.

Original languageEnglish (US)
Title of host publication2015 Conference on Lasers and Electro-Optics, CLEO 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781557529688
StatePublished - Aug 10 2015
Externally publishedYes
EventConference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States
Duration: May 10 2015May 15 2015

Publication series

NameConference on Lasers and Electro-Optics Europe - Technical Digest
Volume2015-August

Other

OtherConference on Lasers and Electro-Optics, CLEO 2015
Country/TerritoryUnited States
CitySan Jose
Period5/10/155/15/15

Keywords

  • Atmospheric measurements
  • Measurement uncertainty
  • Microscopy
  • Nanoparticles
  • Particle measurements
  • Size measurement
  • System-on-chip

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials

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