Abstract
We analyze the performance of feature-specific imaging systems. We study incoherent optical systems that directly measure linear projects of the optical irradiance distribution. Direct feature measurement exploits the multiplex advantage, and for small numbers of projections can provide higher feature-fidelity than those systems that postprocess a conventional image. We examine feature-specific imaging using Wavelet, Karhunen–Loeve (KL), Hadamard, and independent-component features, quantifying feature fidelity in Gaussian-, shot-, and quantization-noise environments. An example of feature-specific imaging based on KL projections is analyzed and demonstrates that within a high-noise environment it is possible to improve image fidelity via direct feature measurement. A candidate optical system is presented and a preliminary implementational study is undertaken.
Original language | English (US) |
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Pages (from-to) | 3379-3389 |
Number of pages | 11 |
Journal | Applied optics |
Volume | 42 |
Issue number | 17 |
DOIs | |
State | Published - Jan 1 2003 |
Externally published | Yes |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering