@inproceedings{f368cffe73db42d2a589b59697fbeed9,
title = "Fault-resilient decoders and memories made of unreliable components",
abstract = "In this paper we present our recent results on iterative Gallager B decoder made of unreliable logic gates. We show evidence that probabilistic behavior of a decoder due to unreliable components can be exploited to our advantage and lead to an improved performance and reduced hardware redundancy. We provide examples of such decoder behavior and give an explanation of this phenomenon using iterative decoding dynamics. Iterative decoding can be viewed as a recursive procedure for Bethe free energy function minimization, and the randomness in a message update may help the decoder to escape from local minima. The decoder operates in a stochastic fashion, but the random perturbations do not require any additional hardware as they are built-in the faulty hardware itself.",
keywords = "Charge carrier processes, Logic gates, Yttrium",
author = "Bane Vasi{\'c} and Predrag Ivanis and Srdan Brkic and Vida Ravanmehr",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; Information Theory and Applications Workshop, ITA 2015 ; Conference date: 01-02-2015 Through 06-02-2015",
year = "2015",
month = oct,
day = "27",
doi = "10.1109/ITA.2015.7308978",
language = "English (US)",
series = "2015 Information Theory and Applications Workshop, ITA 2015 - Conference Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "136--142",
booktitle = "2015 Information Theory and Applications Workshop, ITA 2015 - Conference Proceedings",
}