@inproceedings{7e6eec22687f4d0aa0065948d6064210,
title = "Fast optical profiler",
abstract = "We present the optical design of a fast single shot profiler. A depth resolution of 0.6 micrometer RMS was achieved in an area of 1.2x0.9 mm with a 0.5 second data acquisition time.",
author = "Takeshi Nakazawa and Jose Sasian and Francy Abraham",
year = "2010",
doi = "10.1364/oft.2010.omb4",
language = "English (US)",
isbn = "9781557528933",
series = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America (OSA)",
booktitle = "Optical Fabrication and Testing, OFT 2010",
note = "Optical Fabrication and Testing, OFT 2010 ; Conference date: 13-06-2010 Through 17-06-2010",
}